Bidirectional Reflectance Distribution Function B.R.D.F cos θ,Total Integrated Scattering T.I.S and Power Spectal Density P.S.D

In FILMSCATTER software we use three theoretical framework to calculate the quantities B.R.D.F cos θ and the T.I.S. They are first-order vector perturbation theories for a multilayer stack with random roughness at each interface. The interfaces can be correlated or not. I highly advise you to consult the references below for the validity of these models before you use the software.

## The Bidirectional Reflectance Distribution Function cos θ (B.R.D.F cos θ)

The Bidirectional Reflectance Distribution Function cos θ is calculated versus the scattering angle.

## Total Integrated Scattering (T.I.S)

The Total Integrated Scattering is calculated versus the wavelength.

## Power Spectral Density (P.S.D)

The Power Spectral Density.

References:

- P. Bousquet, F. Flory, and P. Roche, Scattering from multilayer thin films: theory and experiment,J. Opt. Soc. Am., 71: 1115–1123.
- J. M. Elson, "Multilayer-coated optics: guided-wave coupling and scattering by means of interface random roughness," J. Opt. Soc. Am. A 12(4), 729 (1995).
- P. Bussemer, P, K. Hehl, S. Kassam, "Theory of light scattering from rough surfaces and interfaces and from volume inhomogeneities in an optical layer stack," Waves in Random Media: An Institute of Physics Journal; Oct1991, Vol. 1 Issue 4, p207-221, 15p.